FREMONT, Calif.--(BUSINESS WIRE)--Nov. 9, 2005--JEM America, a subsidiary of Japan Electronic Materials Corporation (JEM), has introduced a new series of probe cards aimed at the advanced packaging ...

Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...

Cross-pollination between different industries can yield interesting innovations, and a few years ago [John Wiltrout] developed some non-slip meter probe adapters. He recently used our tips line to ...

Remember fundamentals and practice situational awareness in taking measurements. It’s not only using the right probe, but it’s also using the probe right. Eliminating measurement artifacts is tricky, ...