pv magazine International

Ensemble deep learning for PV cell defect detection

Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...
Science Daily

Researchers use machine learning to detect defects in additive manufacturing

Researchers have developed a new method for detecting defects in additively manufactured components. Researchers at the University of Illinois Urbana-Champaign have developed a new method for ...
Semiconductor Engineering

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
pv magazine International

US researchers use machine learning to detect hidden solar array defects

Researchers from Stony Brook University, in collaboration with Ecosuite and Ecogy Energy, have developed a self-supervised machine-learning algorithm designed to identify physical anomalies in solar ...
Semiconductor Engineering

Detecting Slips, Scratches, Cracks In Wafers And Dies Becoming Harder

Defect detection requirements on the order of 10 defective parts per million (DPPM) are driving improvements in inspection tools’ resolution and throughput at foundries and OSATs. However, defects ...
EurekAlert!

Researchers use machine learning to detect defects in additive manufacturing

Longitudinal (top) and axial (middle) images of X-Ray CT data of parts with 6 internal defects: a spherical clog, a stellated shaped clog, a cone shaped void, a blob shaped void, an elliptical warp of ...