Come learn how to collect measurements on the instrument. Involves hands-on practice of sample alignment and data collection. Due to limited space in the cleanroom, there are only 10 spots available ...

The Ellipsometry is a total optical measurement method. This technique is used to measure the change of polarization of light when passing through a medium. Due to the layer structure during ...

As well as being an extremely effective standalone tool for thermomicrometric sample analysis, Linkam stages are frequently used to add temperature and environmental control to a variety of ...

This free of charge workshop is aimed at both experienced ellipsometry users as well as people new to ellipsometry. The format of the workshop includes an introduction, fundamentals of ellipsometric ...

Artificial intelligence is one of the driving forces in today’s semiconductor industry, with more traditional market drivers like high performance compute and smart phones continuing to play important ...

Metrology supplier Nanometrics Inc. today unveiled an integrated metrology tool combining ultraviolet spectroscopic ellipsometry and deep ultraviolet (DUV) spectroscopic reflectometry. In dielectric ...

In the field of physical optics, a propagating light beam is known as a propagating electromagnetic radiation, with the direction of propagation being horizontal to the direction of the electric and ...

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A new technical paper titled “Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrology” was published by researchers at Samsung. “We propose an ultra-wide-field ...

OMT Instruments produces optical metrology systems for spectral ellipsometry, spectroscopy, machine vision, and video-microscopy. Typical application of our products are the characterization of thin ...