(Nanowerk News) Turning up the intensity of x-ray beams used to probe the atomic structures of materials can actually reduce the intensity of x-rays scattered from the material, a RIKEN-led team has ...

Fluorescence microscopy techniques are powerful tools for probing very small signals and revealing three-dimensional (3D) structural and functional properties of biological samples with high ...

A new research study from Opto-Electronic Advances discusses tailoring electron vortex beams with customizable intensity patterns by electron diffraction holography. In recent years, the scientific ...

Particle size analysis is crucial to quality control and product development in a number of key industries including aerosols, construction, food and beverage, paint and coatings, and pharmaceuticals.

Light fields, as a form of electromagnetic waves, are characterized by fundamental parameters including intensity, phase, and polarization. Precise imaging of these three parameters is crucial for ...

With the development of different techniques for the synthesis of nanomaterials, researchers are constantly looking for a more precise instrument for their nanoscale characterization. X-ray ...

What is the Diffraction Limit? The diffraction limit is a fundamental barrier in optical microscopy that sets the minimum size of features that can be resolved using conventional light microscopes. It ...