Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...

What if manufacturing companies could pinpoint the exact cause of a defect the moment it occurs, preventing costly production delays and ensuring top-notch quality? Generative artificial intelligence ...

In addition to surface and subsurface defects, residual stress represents a concern. Over time, these stress points, ...

Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...

Researchers recently discovered a helicoidal-shaped defect in layered polymers, uncovering how solvents can diffuse through layers and produce color changes. Dr. Edwin L. Thomas, professor in the ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.