Semiconductor Engineering

Parallel RF Test For Next-Generation Communications

The test economics of state-of-the-art smartphones, tablets and routers demand highly parallel RF test. We are addressing this next wave in RF communications test, enabled by Wi-Fi 6E, operating in ...
Business Wire

Keysight Introduces Massively Parallel Board Test System to Enable Higher Throughput in a Smaller Footprint

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that helps enterprises, service providers and governments accelerate innovation to connect ...
Business Wire

Keysight’s New Parallel Parametric Test System Delivers High Throughput and Cost-Effective Wafer Test

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
EDN

A key challenge to mixed-signal SOC and SIP multisite testing: AC instrument channels (Guest commentary)

This is the first article in a two-part series. The next article will explore a cost-effective approach for mixed-signal SOC and SIP multisite testing. Multisite parallel test involves a single tester ...
Semiconductor Engineering

System-Level Test Methodologies Take Center Stage

Because electronic systems for all applications in end-user markets must provide the highest possible reliability to match customers’ quality expectations, semiconductor components undergo multiple ...