TSMC claims its upcoming N2 manufacturing node is ahead of schedule on defect reduction, even though it is the company’s first attempt at gate-all-around (GAA) nanosheet transistor technology.

Cell-aware diagnosis is a new and effective way to detect defects inside standard cells. Industry standard failure analysis (FA) results from a major foundry show that cell-aware diagnosis is very ...

Optimizing CD variation and defect reduction comprehensively, to improve results of a wide defect process window with a narrow CD distribution. This study focused on the defect behavior analysis with ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

TSMC exposed the defect density (D0) of its N2 process technology relative to its predecessors at the same stage of development at its North American Technology Symposium this week. According to the ...