Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...

Probe card demand for 3D ICs is promising, according to IC testing interface solution provider Chunghwa Precision Test Tech (CHPT), which also claimed it will be one of the new suppliers capable of ...

IC test interface specialist WinWay Technology is expected to generate significant growth in probe card sales next year, thanks to strong demand for VPC (vertical probe card) and MEMS products, ...

PARIS — Probe card manufacturer Mesatronic SA is ramping up production of die-on-die (DOD) membrane probes for IC testing, in its 100 class clean room near Grenoble, France. The company is also ...

Test facilities are beginning to implement real-time maintenance, rather than scheduled maintenance, to reduce manufacturing costs and boost product yield. Adaptive cleaning of probe needles and test ...

Wafer level testing is an important part of the supply chain of electronic components. For integrated circuits (ICs), these tests are firmly established – for photonic integrated circuits (PICs), the ...

The continuing advances in semiconductor functionality, density, and chip-level integration are generating new challenges in accessing devices for test and controlling the physical and electrical ...