Modern SoCs are experiencing continued growth in capabilities and design sizes with more and more subsystem IPs being implemented. These large, complex, multi-core SoCs need strategies for DFT and ...
With scaling technology and increasing design sizes, power consumption during test and test data volume have grown dramatically — making it almost impossible to test an entire design once it ...
It is often said that the emergence of the System-on-Chip will require fundamental changes in the approaches to design for testability (DFT.) These changes, it has been suggested, will take the form ...
Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...
New Release Provides Support for Verilog2001 and a Wide Range of Usability Improvements across the Built-In Self-Test Product Line SAN JOSE, Calif. -- Aug. 21, 2007 -- LogicVision, Inc., a leading ...
WILSONVILLE, USA: Mentor Graphics Corp. announced that STMicroelectronics has adopted the TestKompress automatic test pattern generation (ATPG) product into its standard 65nm and 45nm design kits. The ...
The proliferation of semiconductor devices into safety-critical applications such as automotive and medical opens a new can of worms for test and reliability. An ever widening range of devices must ...
In the real world, we are slaves to our environment. The decisions we make are dependent on the resources available at any given time. In school, I remember coming up with a binary decision diagram ...
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