The mechanical characterisation of thin film materials encompasses a suite of experimental and computational methods designed to probe elastic, plastic and fracture behaviour at sub-micrometre scales.

Thin film materials underpin a broad range of modern technologies, from optoelectronic devices and solar cells to sensors and flexible displays. The optical characterisation of these films yields ...

A German–Israeli research team led by Dr. Andreas Furchner has demonstrated how imaging ellipsometry enables non-destructive characterization and quality control of microstructured MXene thin films ...

(A) a single magnetic domain and (B) multiple magnetic domains with opposite polarization. (C) Following the subtraction of image (A) from image (B), a Kerr image with sharp contrast is obtained [39].

In this article, we explore how X-ray diffraction, also known as XRD, can be used to analyze thin films and the benefits of using this technique. Many materials are now processed in the form of thin ...

insights from industryDr. Max Junda & Dr. Lyle GordonSenior Member of the Technical Staff and Director of MaterialsCovalent Metrology In this interview, AZoMaterials speaks with Dr. Max Junda, Senior ...

Diagram of an X-ray Reflectometry (XRR) setup: This schematic shows the arrangement of the X-ray tube, Gӧbel mirror, sample holder, and detector. The X-rays are emitted from the tube, shaped by slits ...

Thin films form the basis of many industries today, including semiconductors, electric vehicles, smart optical coatings, sophisticated medical equipment, and protective layers on high-temperature ...

Dendritic structures that emerge during the growth of thin films are a major obstacle in large-area fabrication, a key step towards commercialization. However, current methods of studying dendrites ...