Over the last decade, there has been a move away from powered-up digital in-circuit vector testing to unpowered analog-based (vectorless) device-pin opens testing for large and sometimes small digital ...

Design-for-test (DFT) tools are smoothing the way toward complex device designs that are readily testable on economical ATE systems. Vendors of DFT and built-in-self-test (BIST) tools have been ...

Agilent Technologies' Measurement Systems Division has extended the capabilities of its vectorless printed-circuit-board test technology with the release of Medalist iVTEP (intelligent Vectorless Test ...

Agilent Technologies’ new Cover-Extend Technology is a hybrid between two established test methods for manufacturing test: boundary scan and VTEP vectorless test. Part of the company’s VTEP v2.0 ...

The Joint Test Action Group (JTAG) formed in Europe in the late 1980s. Up until that time, most printed circuit boards (PCBs) were populated with chips that had exposed pins that were soldered through ...